Group leaders: Dana Vasilјević Radović and Danijela Ranđelović
The group deals with characterization of nanomaterials and structures, MEMS and NEMS devices and systems. The methods of scanning probe micrscopy are used (atomic force microscopy, AFM), ultraviouled, visible and infrared spectrscopy, as well as infrared microscopy.
Topics
- Atomic force microscopy
- Nanofabrication by scanning probe (nanoscratching)
- UV, visible and IR spectroscopy
- IR microscopy
- Hall measurements